Datum der Disputation
- 24.8.2023
Precise quantification of forces and charges at the atomic scale by non-contact atomic force and charge force microscopy
Dissertation
Überblick
Schlagwörter
- Atomic Force Microscopy
- Charge Force Microscopy
- Cluster
- Finite-Element method
- Insulators
- Kelvin Probe Force Microscopy
- Non-Contact Atomic Force Microscopy
- Oxide surface
- Scanning Probe Microscopy
- Solid surfaces
- Solid-solid interfaces
- cantilever
- catalysis
- cerium dioxide
- classical electromagnetism
- gold nanoparticle
- inclined oscillation
- quantitative charge measurement
- sampling path
- quantitative force measurement