Precise quantification of forces and charges at the atomic scale by non-contact atomic force and charge force microscopy
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Datum der Disputation

  • 24.8.2023

Autor:in

  • Heile, Daniel

Erstbetreuer:in

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Schlagwörter

  • Atomic Force Microscopy
  • Charge Force Microscopy
  • Cluster
  • Finite-Element method
  • Insulators
  • Kelvin Probe Force Microscopy
  • Non-Contact Atomic Force Microscopy
  • Oxide surface
  • Scanning Probe Microscopy
  • Solid surfaces
  • Solid-solid interfaces
  • cantilever
  • catalysis
  • cerium dioxide
  • classical electromagnetism
  • gold nanoparticle
  • inclined oscillation
  • quantitative charge measurement
  • sampling path
  • quantitative force measurement

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