Leveraging Additive Manufacturing for Optical Quality Control: Open Source Hardware Meets Open Innovation
Dissertation uri icon

Datum der Disputation

  • 7.10.2024

Schlagwörter

  • Additive Manufacturing
  • Open Source
  • Quality Control
  • Photonik

AutorInnen

  • Toschke, Yannic

Erstbetreuer:in

Digital Object Identifier (DOI)

Fach