Sparse super resolution in microscopy: Condition, diffraction limit and trigonometric approximations
Dissertation uri icon

Datum der Disputation

  • 15.2.2024

Autor:in

  • Hockmann, Mathias Max

Erstbetreuer:in

Digital Object Identifier (DOI)

Schlagwörter

  • Christoffel function
  • Condition
  • Cramer-Rao lower bound
  • Minorant function
  • Rayleigh limit
  • Resolution limit
  • SIM
  • STORM
  • Vandermonde matrix
  • Super resolution

Fach